Noise in Digital Magnetic RecordingThis book treats the various aspects of noise from magnetic recording media and the impact on system performance. Several authors present discussions of: materials and processes used to fabricate media for computer data storage, theoretical aspects of noise and micromagnetic behavior, experimental methods and characterization, and system analysis. In the past decade thin film recording media have largely displaced particlate media in rigid disk recording systems. During the same period of time the field has evolved from the prevalent belief that thin film media were virtually noiseless to a detailed understanding of the origin and the manifestation of noise in these new media. This understanding has lead to the ability to make the very low noise media needed in present applications. The present state of understanding of both particulate and thin film media is summarized. |
Contents
Introduction | 1 |
Measured Noise in Thin Film Media | 65 |
Theoretical Considerations of Media Noise | 101 |
Imaging Methods for the Study of Micromagnetic Structure | 141 |
Micromagnetic Modeling of Thin Film Recording Media | 181 |
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3D-random alloys amplitude anisotropy Arnoldussen average bandwidth Belk calculated coercivity contrast correlation Cr underlayer dc erase demagnetized detector direction distribution domain domain wall easy axis effect electron Electron Microscopy error rate experimental Ferrier ferromagnetic Figure film media filter frequency function grain hâ‚‚ IEEE IEEE Trans increase intergranular exchange coupling intrinsic noise jitter Kerr longitudinal Lorentz low noise Magn magnetic field Magnetic Recording magnetisation magnetization pattern magnetostatic magnetostatic interaction media noise medium method micromagnetic Microscopy microstructure modulation noise noise measurements noise power noise sources parameter particles particulate particulate media peak perpendicular recording Phys pulse random readback recording density recording head rigid disk sample saturation segregation shows signal spatial specimen spectrum analyzer sputtering structure substrate surface techniques thickness thin film recording thin-film disk thin-film media total noise track edge track width transition length transition noise values voltage vortex zero Zhu and Bertram
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