ProceedingsIEEE Computer Society Press - Computer integrated manufacturing systems |
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Page 205
Before the transitions between contact states are examined, we first further
investigate the effects of the required contact force. This contact force presses the
DLO against the obstacle, causing a deformation. For the stable E/FpoiM and the
...
Before the transitions between contact states are examined, we first further
investigate the effects of the required contact force. This contact force presses the
DLO against the obstacle, causing a deformation. For the stable E/FpoiM and the
...
Page 206
This means identifying vertices, edges or faces is not necessary for detecting
contact state transitions. For this reason and because we assume a static
environment, we can use the work piece motion to segment background and
foreground [5] ...
This means identifying vertices, edges or faces is not necessary for detecting
contact state transitions. For this reason and because we assume a static
environment, we can use the work piece motion to segment background and
foreground [5] ...
Page 207
This is the characteristic feature for all transitions from N to any other contact state
, including all instable ones. This loss of motion may be detected by comparing
successive difference images. The result of such a comparison of the last two ...
This is the characteristic feature for all transitions from N to any other contact state
, including all instable ones. This loss of motion may be detected by comparing
successive difference images. The result of such a comparison of the last two ...
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Contents
Microassembly Microfactory | 1 |
Microassembly and Microfactory | 2 |
Process Planning | 24 |
Copyright | |
7 other sections not shown
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Common terms and phrases
actuator applied approach Assembly and Task assembly model assembly operation assembly planning assembly process assembly sequence assembly system assembly tasks axis B-spline batch blocks C-space cell cleanroom components computation configuration configuration space considered contact angle cost cycle defined deflexions developed device disassembly sequence duo-bi environment equation equipment evaluation Figure flexible genetic algorithm geometric gripper HACCP haptic heuristic holons hypergraph IEEE International Symposium industrial industrial robot integrated interface linear manipulation mechanism metaheuristic method micro micro-motor microfactory motion node obtained optical tweezers optimal paper parameters path planning performance Petri nets piezoelectric placement position precedence graphs problem Proc proposed PVDF representation represented Robotics and Automation rotation scheduling sensor simulation solution space sub tour sub-bins subassemblies surface Symposium on Assembly Task Planning Besancon Technology tion tolerancing torque trajectory transition virtual voxels workstation
Bibliographic information
| Title | Proceedings |
| Author | IEEE International Symposium on Assembly and Task Planning |
| Contributors | IEEE Robotics and Automation Society, IEEE Xplore (Online service) |
| Publisher | IEEE Computer Society Press |
| Original from | the University of Michigan |
| Digitized | 11 Jan 2008 |
| Export Citation | BiBTeX EndNote RefMan |