Electron Microscopy: Abstracts of Papers Presented to the ... International Congress on Electron Microscopy, Volume 1Australian Academy of Science, 1982 - Electron microscopy |
Contents
Cryofixation | 1 |
Instrumentation for Cryosectioning | 9 |
Cryoprotection on Organic Specimens | 19 |
Copyright | |
36 other sections not shown
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Common terms and phrases
aberration analysis angle aperture application atoms averaging beam biological calculated carbon cell changes compared contrast correction corresponding crystal density dependence detector determined developed diffraction direction distribution dose edge effect electron beam Electron Microscopy elements emission energy energy loss example excitation factor field Figure filter function given important improved incident increase intensity layer lens limited lines lithography magnetic material means measured method micrographs microscope mode noise object observed obtained operation optical parameters particles pattern peak performed phase Phys plane position possible present probe Proc processing projection quantitative range ratio reconstruction recording References region resolution respectively sample scanning scattering shown shows signal single specimen STEM structure surface technique temperature thickness thin tilt tion University values voltage wave X-ray