Electron Microscopy 1982: Paper[s] Presented at the 10th International Congress on Electron Microscopy Held in Hamburg, West Germany, August 17-24, 1982, Volume 1Deutsche Gesellschaft für Elektronenmikroskopie, 1982 - Electron microscopy |
Contents
Cryofixation | 1 |
Instrumentation for Cryosectioning | 9 |
Cryoprotection on Organic Specimens | 19 |
Copyright | |
54 other sections not shown
Common terms and phrases
analysis angle aperture astigmatism atoms averaging axial axis backscattered biological Boersch calculated carbon cathode cell chromatic aberration coil crystal CTEM density detector diameter diffraction pattern diffractograms distribution dose edge electron beam electron diffraction electron energy electron gun Electron Microscopy electron optical elements energy loss experimental Figure film filter foil Fourier function high resolution holography illumination image processing intensity Kogakuin University lattice layer lenses magnetic magnification measured method microanalysis Microsc microscope mode molecules noise objective lens observed obtained Optik parameters particles peak phase contrast Phys pixel plane polepiece Proc quantitative ratio reconstruction recording sample scanning electron scanning electron microscope scattering sections shown in Fig shows signal Somlyo spatial specimen spectra spectrometer spectrum spherical aberration sputter deposition STEM structure surface technique temperature thickness thin tilt tion transmission electron microscope Ultramicroscopy vacuum values voltage wave X-ray